PIPages
Labs

Abhijit Chatterjee

Georgia Institute of Technology, GA·Engineering

Computer chips now hold billions of transistors and are pushed to low voltages and tiny sizes, which makes them more likely to have hidden manufacturing flaws or to suffer random errors while running. A faulty chip that slips through testing can fail in the field, and for artificial intelligence (AI) systems in cars or robots, such failures can be dangerous.

Fields

Engineering

Computer Science

Topics

integrated circuit testing

VLSI test

cell aware test

Grants
2 known grants, through Sep 2027

What they work on

  1. Develop post-manufacture test and tuning algorithms for deep neural networks running on analog crossbar arrays, recovering accuracy lost to manufacturing variation in seconds rather than hours and detecting shorts and opens.
  2. Build on-line methods that detect, diagnose and correct radiation- and noise-induced soft errors in digital and analog AI accelerators with near-zero latency and no retraining, across transformers, recurrent and spiking networks.
  3. Replace exhaustive circuit simulation in cell aware test with analytical reasoning to generate compact tests for defects inside standard cells across wide ranges of defect resistance.
  4. Capture how a single defect's timing delay spreads across interconnected cells, so that generated tests reduce escapes of timing faults in deeply scaled integrated circuits.

More about the research

The projects develop algorithms that find defective chips more cheaply after manufacture and keep AI hardware working correctly despite flaws and noise.

Why it matters

Cheaper, more complete chip tests could reduce the number of faulty integrated circuits reaching computers, vehicles and defense systems, and lower manufacturing and test costs for chip makers. Fast tuning and real-time error correction for AI accelerators could make AI hardware dependable enough for safety-critical uses such as transportation and robotics, while supporting energy-efficient analog designs.

Known grants

From NIH and NSF research grants. Labs often have other funding we can't see.

Collaborative Research: An Effective and Efficient Low-Cost Alternate to Cell Aware Test Generation for Cell Internal Defects

NSF · Oct 2023 – Sep 2027

Error Tolerant Machine Learning Systems: Off-Line Test and Tuning and On-Line Correction

NSF · Jun 2024 – May 2027

Closest labs

Sumit Jha

University of Florida, FL·Computer Science

Develop formal verification methods that prove neural networks run correctly when accelerated on analog in-memory computing hardware, which can be more error-prone than standard CMOS chips.

Deliang Fan

Arizona State University Campus Immersion, AZ·Engineering·Early-career

Design, fabricate and validate a hybrid in-memory computing chip that combines RRAM, a non-volatile resistive memory, with SRAM to run deep neural networks with high energy efficiency.

Qian Yu

University of California-Santa Barbara, CA·Engineering

Develop a highly compressed training method for physics-informed neural networks (PINNs) that uses only forward passes and no backpropagation, so it can run on photonic chips without photonic memory.

The school

Georgia Institute of Technology: 50 labs on PI Pages, $1.5B a year on research, 572 research doctorates a year.

More about Georgia Institute of Technology

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